qualcomm CVEs

Information disclosure while creating MQ channels.

Memory corruption while processing IOCTL calls to add route entry in the HW.

Memory corruption while accessing MSM channel map and mixer functions.

Memory corruption while invoking IOCTL map buffer request from userspace.

Memory corruption occurs during the copying of read data from the EEPROM because the IO configuration is exposed as shared memory.

Memory corruption while handling file descriptor during listener registration/de-registration.

Cryptographic issues while generating an asymmetric key pair for RKP use cases.

Memory corruption while processing IOCTL calls.

There may be information disclosure during memory re-allocation in TZ Secure OS.

Memory corruption while assigning memory from the source DDR memory(HLOS) to ADSP.

Memory corruption while calling the NPU driver APIs concurrently.

Memory corruption occurs during an Escape call if an invalid Kernel Mode CPU event and sync object handle are passed with the DriverKnownEscape flag reset.

Memory corruption while doing Escape call when user provides valid kernel address in the place of valid user buffer address.

Memory corruption may occur in keyboard virtual device due to guest VM interaction.

Memory corruption while reading a type value from a buffer controlled by the Guest Virtual Machine.

Memory corruption while processing input message passed from FE driver.

Memory corruption while reading a value from a buffer controlled by the Guest Virtual Machine.

Memory corruption may occur while processing message from frontend during allocation.

Transient DOS may occur while processing the country IE.

Transient DOS can occur while processing UCI command.

Memory corruption in display driver while detaching a device.

Memory corruption may occur while accessing a variable during extended back to back tests.

Memory corruption may occur during communication between primary and guest VM.

Memory corruption may occur while validating ports and channels in Audio driver.

Memory corruption may occur due to improper input validation in clock device.